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electron backscatter diffraction ebsd mapping  (JEOL)


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    JEOL electron backscatter diffraction ebsd mapping
    Electron Backscatter Diffraction Ebsd Mapping, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 10857 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscatter+diffraction+maps/10__1016_slash_j__msea__2025__148199-122-0-12?v=JEOL
    Average 97 stars, based on 10857 article reviews
    electron backscatter diffraction ebsd mapping - by Bioz Stars, 2026-07
    97/100 stars

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    Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 1. (a) Illustration of typical microstructure of as-deposited cold sprayed Cu after [14]. Small grains due to dynamic recrystallization (DRX) are located near the splat-splat interfaces, while towards the interior of the splats subgrains and deformed large grains are present. The local region of EBSD and nanoindentation mapping in the current study is indicated in (b).

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: Recrystallization

    Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 3. SEM/EBSD/nanoindentation results of the as-deposited CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques:

    Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Journal: Materials Science and Engineering: A

    Article Title: Submicrometer Scale Mapping of Microstructure and Mechanical Properties of Cold Sprayed Copper

    doi: 10.1016/j.msea.2024.147556

    Figure Lengend Snippet: Fig. 4. SEM/EBSD/nanoindentation results of the 350 ◦C annealed CS-Cu N2 sample: (a) BSE image, (b) SE image, (c) IPF map, (d) GBCD map with the Brandon criterion, (e) KAM map, (f) GND map overlaying with the grain boundaries (misorientation angle >5◦) in black lines, (g) BSE image after nanoindentation, (h) hardness map.

    Article Snippet: Electron backscatter diffraction (EBSD) mapping was performed using a Bruker QUANTAX EBSD system at 15 kV.

    Techniques: